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SonoLab delivers a comprehensive range of inspection services. From Research and Development to Failure Analysis to Industry and Military Qualification, SonoLab’s unmatched combination of experience and technology ensures that you’ll get the best results.
• Research and development (R&D)
• Process development
• Process verification
• Failure analysis
• Production screening
• Lot qualification
• Component reclamation
• Constructional analysis
• Fabless audit services
• Material characterization
• Industry qualification
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ANSI/EIA STANDARD 469C:
“Standard Test Method for Destructive Physical Analysis of High Reliability Ceramic Monolithic Capacitors,”
February 18, 1997
www.eia.org
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IPC/JEDEC J-STD-020C:
“Moisture/Reflow Sensitivity Classification for Non-Hermetic Solid State Surface Mount Devices,”
July 2004
www.ipc.org and www.jedec.org
J-STD-020C(7-8-04).pdf |
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IPC/JEDEC J-STD-035:
“Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components,”
May 1999
www.ipc.org and www.jedec.org
jstd35.pdf |
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MILITARY SPECIFICATION MIL-PRF-123D:
“Capacitors, Fixed, Ceramic Dielectric, (Temperature Stable and General Purpose), High Reliability, General Specification,” March 17, 2006
www.dscc.dla.mil
prf123D.pdf |
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MILITARY SPECIFICATION MIL-PRF-31033A:
“Capacitors, Fixed, Ceramic Dielectric, High Reliability, Discoidal, General Specification For,”
November 3, 2003
www.dscc.dla.mil
prf31033A.pdf |
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MILITARY SPECIFICATION MIL-PRF-49470B:
“Capacitor, Fixed, Ceramic Dielectric, Switch Mode Power Supply,”
January 13, 2003
www.dscc.dla.mil
prf49470B.pdf |
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MILITARY STANDARD MIL-STD-883G, METHOD 2030:
“Ultrasonic Inspection of Die Attach,”
February 20, 2006
www.dscc.dla.mil
std883GMethod2030.pdf |
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MILITARY STANDARD MIL-STD-883G, METHOD 2035:
“Ultrasonic Inspection of Tab Bonds,”
February 20, 2006
www.dscc.dla.mil
std883GMethod2035.pdf |
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MILITARY STANDARD MIL-STD-1580B, REQUIREMENT 16.5.1.3:
“Destructive Physical Analysis for Electronic, Electromagnetic, and Electromechanical Parts,”
January 7, 2003
www.dscc.dla.mil
std1580B.pdf
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NASA, PEM-INST-001:
“Instructions for Plastic Encapsulated Microcircuit (PEM) Selection, Screening, and Qualification,”
June 2003
www.sti.nasa.gov
PEM-INST-001_June_03_Final.pdf |
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