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Home > Leadership > History
History
Sonoscan originated Acoustic Micro Imaging by developing the first commercially available acoustic microscope, SLAM™, in 1975. Through persistent innovation and a passion for continuous improvement, we have remained the most trusted authority on the application of AMI technology for nondestructive inspection and analysis.

As a customer, this means maximum confidence against costly production shutdowns, quarantined products and very disappointed customers.
1974 - Began operations (Chicago, IL)

1975 - Shipped the first-ever commercial acoustic microscope, SLAM

1977 - Opened main applications development laboratory

1984 - First analog C-SAM® acoustic microscope developed under "Star-Wars" contract

1987 - Digital C-SAM acoustic microscope developed (patents issued)

1989 - Acoustic Impedance Polarity Detection (AIPD) Patent

1995 - Sonoscan Silicon Valley

1997 - 230 MHz transducer technology developed for Flip Chip

1997 - FACTS2™ (Fast Automated C-SAM Tray Scanning System) patent issued

1998 - Sonoscan Southwest

1999 - Sonoscan Europe

2002 - Automated system for wafer inspection and small part hold-down patents issued

2004 - Turbo speed developed for high frequency and high resolution applications

2005 - VRM™ (Virtual Rescanning Mode) and FDI™ (Frequency Domain Imaging) patents issued

2006 - Sonoscan China and Taiwan

2007 - Thickness Measurement Module & Automated Flip Chip Analysis Functions were released

2008 - ASF™ (Acoustic Surface Flatness) measurement mode (patents issued)

2009 - First automated C-SAM for 300mm wafer inspection

2010 - FastLine P300™ manual screening system for manufacturing floor (patent pending)

2010 - PolyGate™ platform released with the P300™ system

2011 - Gen6™ laboratory system introduced with PolyGate™ platform

2012 - SonoSimulator™ is released to enable simplified analysis of stacked die devices

 
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