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Sonoscan originated Acoustic Micro Imaging by developing the first commercially available acoustic microscope, SLAM™, in 1975. Through persistent innovation and a passion for continuous improvement, we have remained the most trusted authority on the application of AMI technology for nondestructive inspection and analysis.
As a customer, this means maximum confidence against costly production shutdowns, quarantined products and very disappointed customers. |
| - Began operations (Chicago, IL) |
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| - Shipped the first-ever commercial acoustic microscope, SLAM |
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| - Opened main applications development laboratory |
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| - First analog C-SAM® acoustic microscope developed under "Star-Wars" contract |
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| - Digital C-SAM acoustic microscope developed (patents issued) |
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| - Acoustic Impedance Polarity Detection (AIPD) Patent |
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| - Sonoscan Silicon Valley |
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| - 230 MHz transducer technology developed for Flip Chip |
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| - FACTS2™ (Fast Automated C-SAM Tray Scanning System) patent issued |
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| - Sonoscan Southwest |
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| - Sonoscan Europe |
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| - Automated system for wafer inspection and small part hold-down patents issued |
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| - Turbo speed developed for high frequency and high resolution applications |
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| - VRM™ (Virtual Rescanning Mode) and FDI™ (Frequency Domain Imaging) patents issued |
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| - Sonoscan China and Taiwan |
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| - Thickness Measurement Module & Automated Flip Chip Analysis Functions were released |
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| - ASF™ (Acoustic Surface Flatness) measurement mode (patents issued) |
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| - First automated C-SAM for 300mm wafer inspection |
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| - FastLine P300™ manual screening system for manufacturing floor (patent pending) |
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| - PolyGate™ platform released with the P300™ system |
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| - Gen6™ laboratory system introduced with PolyGate™ platform |
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| - SonoSimulator™ is released to enable simplified analysis of stacked die devices |
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