Sonoscan
About Us | Careers | Contact | InstaQuote | Tech Support  |      
Data Accuracy
Image Quality
Technical Leadership
Educational Programs
History
Patents
Contact Us
News & Events
Home > Leadership > News & Events
News & Events
Tradeshows

Sonoscan Launches HiRes Generation THRU-Scan, July 1, 2008
Sonoscan has introduced the HiRes Generation THRU-Scan™, which significantly enhances through-transmission imaging with Sonoscan’s C-SAM® line of acoustic microscopes.  
More

Sonoscan Introduces Acoustic Profiling Module, March 24, 2008
Sonoscan has introduced a new capability for its line of C - SAM acoustic microscopes that reveals the external surface topography of a device at the same time as its internal features.  Known as the Acoustic Surface Profile (ASP) module, this important mode can be used to measure warpage of plastic integrated circuits, flip chips, substrates, circuit boards, etc., without any sample preparation.  
More

Automated Bonded Wafer Inspection Tool From Sonoscan, December 7, 2007
Sonoscan has introduced the AW200™ Series C-SAM® acoustic micro imaging system, which performs automated inspection, analysis and sorting of bonded wafers up to 200mm (8 in.) in diameter
More

Sonoscan Lab Aids In Investigation for "Dan Rather Reports," November 12, 2007
Sonoscan’s Silicon Valley applications laboratory (SSV) in Santa Clara, CA was selected recently to appear in an episode of HDNet’s “Dan Rather Reports” dealing with the testing of composite materials. 
More

Sonoscan Updates Its "Gold Standard" C-SAM® System, July 5, 2007
Sonoscan today unveiled the new D-9500™ update of its popular C-SAM® acoustic microscope system. The contemporary D-9500 replaces the widely used “gold standard” D-9000 system in Sonoscan’s line-up, and like the D-9000 excels in failure analysis, product development, material characterization and low-volume production.
More

Sonoscan Shows Delamination Breakthrough, May 16, 2007
Sonoscan has demonstrated that some delaminations in plastic IC packages contain not only air but also a fluid contaminant, and that such 2-part delaminations can be imaged and characterized by C-SAM® acoustic microscope systems.
More

Sonoscan Names Sales Manager for China, April 13, 2007
Sonoscan, Inc., the designer and manufacturer of advanced acoustic microscopy systems, has announced the appointment of Ginny Ho as Regional Sales Manager with responsibility for China and Hong Kong. More

Sonoscan Expands Transducer Fab & Optimization, March 27, 2007
Sonoscan, Inc., the designer, developer and manufacturer of acoustic microscopes, has recently expanded its transducer operation, where new ultra-high frequency ultrasonic transducers used in the microscopes are designed and optimized.
More


Sonoscan's Dr. Kessler Receives OECE Award, February 15, 2007
Dr. Lawrence W. Kessler, Founder, CEO and President of Sonoscan, Inc., has received the Outstanding Electrical and Computer Engineer (OECE) award from Purdue University.
More


Sonoscan Ships New Gen5™ C-SAM® Model, January 15, 2007
Sonoscan today announced that the first shipments of the Gen5™ Scanning Acoustic Microscope were made during their most recent fiscal quarter.  This newest addition to the family of C-SAM® C-Mode instruments was initially introduced at the Semicon West show in July, 2006.  Due to its enthusiastic reception, development was completed and the first customer orders were accepted in late summer.
More


Sonoscan Expands FACTS2™ Production, December, 2006
Sonoscan has expanded and upgraded the assembly line that makes the FACTS2 automated acoustic microscope systems, which is widely used to identify and remove from production microelectronics components having hidden defects that can cause expensive field failures.
More


Sonoscan Ships New-Generation Wafer Inspection System, October, 2006
Sonoscan has just shipped the first of its newest next-generation automated bonded wafer inspection systems to a Pacific Rim customer.
More


Sonoscan Launches UPH-Turbo™ For High-Speed Scanning, September, 2006
Sonoscan, Inc., the designer and manufacturer of acoustic microscope systems, has introduced UPH-Turbo™, a new method of acoustic scanning that gives greater units-per-hour throughput for both automated and manual Sonoscan systems.
More


Sonoscan Receives Patent For Frequency Domain Imaging, July, 2006
Sonoscan, Inc., the developer and manufacturer of acoustic microscope systems, has been issued U.S. Patent #6,890,302 that gives engineers a new tool for diagnosing packaging defects. This is one of several patents issued to Sonoscan in the past year.
More


Sonoscan Granted Patent On Virtual Rescanning Acoustic Microscope, April, 2006
Sonoscan, Inc., the designer and maker of acoustic microscope systems, has been granted US Patent #6,895,820 covering the firm’s Virtual Rescanning Module™ (VRM™).
More


Sonoscan Sees Automation Driving Demand For Mass Component Screening, March, 2006
The need for highly automated electronic production, along with higher expectations for product reliability, are driving the demand for automated acoustic imaging of flip chips and plastic integrated circuit packages, Sonoscan, Inc., the maker of acoustic microscope systems, has reported.
More 

International Conference on Smart Materials, Structures and Systems
July 24-26, 2008
Bangalore, India

SMTA International
August 19-20, 2008
Orlando, FL

Semicon Taiwan
September 9-11, 2008
Taipei, Taiwan

ESREF
September 29-October 2, 2008
Maastricht, The Netherlands

Semicon Europa
October 7-9, 2008
Stuttgart, Germany

ISTFA
November 4-5, 2008
Portland, OR

IMAPS
November 2-6, 2008
Providence, RI

Semicon Japan
December 3-5, 2008
Tokyo, Japan

EPTC
December 10-11, 2008
Singapore

AMI Basics

Publications