Elk Grove Village IL, March 24, 2008 --Sonoscan has introduced a new capability for its line of C - SAM acoustic microscopes that reveals the external surface topography of a device at the same time as its internal features. Known as the Acoustic Surface Profile (ASP) module, this important mode can be used to measure warpage of plastic integrated circuits, flip chips, substrates, circuit boards, etc., without any sample preparation.
ASP is available as a cost effective option on new C-SAM acoustic microscope systems as well as a retrofit to many systems acquired over the last few years. ASP works by collecting acoustic surface data and displaying it as a color-coded image in which each color corresponds to a topographical distance measurement. The sensitivity of the ASP is in the micron range and is not dependant upon the surface smoothness, color or optical characteristics.
Warpage at the surface of a part is often associated with internal problems such as cracks and delaminations that can cause electrical failures. For example, the surface profile of a plastic-encapsulated IC may show warpage in one quadrant. Internally, the same quadrant may reveal lead-frame delaminations. Having both images makes it easier to identify the processes that are causing the problem.
The value of ASP is that it displays both the surface profile and the internal features on a single instrument, eliminates the need to buy a second instrument, and requires no additional scanning time, as the profile data is taken at the same time as the acoustic image data. If a part is tilted, ASP corrects for tilt before profiling the surface.
For more information, contact Steve Martell, manager of technical support services.
Sonoscan, Inc., 2149 E. Pratt Blvd., Elk Grove Village IL USA 60007
Phone: 847 437-6400 Fax: 847 437-1550
E-mail: info@sonoscan.com Website: www.sonoscan.com
Photo caption: Planar acoustic image of BGA (left) reveals multiple anomalies (yellow, dark gray) between molding compound and substrate around the periphery of the component. Acoustic Surface Profile (right) shows that the vertical warpage from the center of the part to the corners is 125 microns. Contamination gives this delamination two colors in the C-SAM acoustic image: red = air, white = fluid contaminant.
About Sonoscan: Sonoscan is the leading developer and manufacturer of acoustic microscopy systems, widely used for non-destructive imaging and analysis of internal features. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis, and FACTS2™ for automated production inspection. Sonoscan application engineers, with a total of more than two centuries’ experience in acoustic microscopy, conduct frequent workshops and seminars. SonoLab, a division of Sonoscan, operates application testing laboratories in 7 global locations.
