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Home > Resources > Application Notes > Application Note 540
Application Note #0540 – Chip Scale Package (CSP)
Massive Internal Delamination

Massive delamination shown in red

Sample & Method

In this CSP the die is mounted to an elastomer material, which is then attached to a flex substrate with solder balls. The interconnections between the die and substrate are done with TAB (Tape Automated Bond) like connections. This part is flipped over and viewed through the solder ball/flex substrate side.

Result

In the acoustic image, the traces run from chip, but seem to disappear when they encounter the large red area. This area is a massive delamination within the polyimide. Since the delamination reflects all the ultrasound to the transducer, there is no reflection from the traces behind the delamination.

Microelectronics

MEMS

Mil/Aero/Auto

Materials

Other Applications