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| Many industry standards that are relied upon today have been researched, authored or partially authored by Sonoscan’s acoustic engineers. For more information regarding industry standards, contact Sonoscan at 847-437-6400. |
ANSI/EIA STANDARD 469C:
“Standard Test Method for Destructive Physical Analysis of High Reliability Ceramic Monolithic Capacitors,”
February 18, 1997
www.eia.org
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IPC/JEDEC J-STD-020C:
“Moisture/Reflow Sensitivity Classification for Non-Hermetic Solid State Surface Mount Devices,”
July 2004
www.ipc.org and www.jedec.org
J-STD-020C(7-8-04).pdf |
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IPC/JEDEC J-STD-035:
“Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components,”
May 1999
www.ipc.org and www.jedec.org
jstd35.pdf |
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MILITARY SPECIFICATION MIL-PRF-123D:
“Capacitors, Fixed, Ceramic Dielectric, (Temperature Stable and General Purpose), High Reliability, General Specification,” March 17, 2006
www.dscc.dla.mil
prf123D.pdf |
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MILITARY SPECIFICATION MIL-PRF-31033A:
“Capacitors, Fixed, Ceramic Dielectric, High Reliability, Discoidal, General Specification For,”
November 3, 2003
www.dscc.dla.mil
prf31033A.pdf |
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MILITARY SPECIFICATION MIL-PRF-49470B:
“Capacitor, Fixed, Ceramic Dielectric, Switch Mode Power Supply,”
January 13, 2003
www.dscc.dla.mil
prf49470B.pdf |
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MILITARY STANDARD MIL-STD-883G, METHOD 2030:
“Ultrasonic Inspection of Die Attach,”
February 20, 2006
www.dscc.dla.mil
std883GMethod2030.pdf |
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MILITARY STANDARD MIL-STD-883G, METHOD 2035:
“Ultrasonic Inspection of Tab Bonds,”
February 20, 2006
www.dscc.dla.mil
std883GMethod2035.pdf |
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MILITARY STANDARD MIL-STD-1580B, REQUIREMENT 16.5.1.3:
“Destructive Physical Analysis for Electronic, Electromagnetic, and Electromechanical Parts,”
January 7, 2003
www.dscc.dla.mil
std1580B.pdf
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NASA, PEM-INST-001:
“Instructions for Plastic Encapsulated Microcircuit (PEM) Selection, Screening, and Qualification,”
June 2003
www.sti.nasa.gov
PEM-INST-001_June_03_Final.pdf |
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