Sonoscan
About Us | Careers | Contact | InstaQuote | Tech Support  |      
AMI Overview
Imaging Modes
Advanced Features
Technology Applications
Advanced Features
Sonoscan scientists and engineers work closely with the applications development team to continually develop advanced systems and techniques. The result is unrivaled technology supported by multiple patents.

All in all, Sonoscan’s advanced features provide you with better results, improved efficiency, and a higher level of analysis.
Features include:
Delivers the most accurate defect detection, and reliably detects delaminations as thin as 200 Angstroms.

Uses advanced algorithms to quantify the interface data and allows you to set accurate, automatic, accept/reject criteria.

Collects and digitally stores comprehensive acoustic data enabling you to perform a complete analysis of a sample, even when it is no longer available.

Allows you to select any single frequency or a range of frequencies to capture and utilize for imaging. FDI brings out subtle details that are not easily detected with conventional pulse-echo methods (Time Domain Imaging).

Another way of expressing any image that utilizes “time” as a reference, such as standard A-Scan, B-Scan and C-Mode type images, which are all based on time.

Delivers fast scanning without requiring immersion, ideal for production scanning and moisture-sensitive devices.

Allow for very high speed, vibration-free scanning.

Considered to be a “Virtual Cross-section” of the sample.


Delivers imaging at ultra-high frequencies with application optimized transducers.

Allows you to efficiently evaluate components in fewer scans. 

Provides faster imaging speeds at high frequencies with up to 2.5X increased image acquisition speed (less time) at high pixel densities.

AMI Glossary

Application Notes

FAQs

Mode Examples