Sonoscan
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AMI Overview
Imaging Modes
Advanced Features
Technology Applications
C-Mode
A C-Mode image is created by focusing and collecting information from a particular plane in the sample. This image was created by focusing at the chip to underfill/bump level in a flip chip device. Details from this level are seen well since the focus is optimized for this level. How the signal is reflected from this level provides information about that level. For example, the two bright features indicate defects at those locations. Also note the detail of the device structure.

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