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The Q-BAM imaging mode provides a nondestructive cross-sectional view of a sample. To provide the most accurate depth and image amplitude/polarity information, the Q-BAM operates such that it maintains the appropriate focus at each level of the scan. The lower half of this picture shows the Q-BAM view of this TQFP taken across the white line. Note that the die surface is entirely delaminated (red) and cracks (vertical line) propagate from the die towards the package surface.