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(Click on the location to register)
For your convenience,
seminars are offered two times per day:
Addison Conference Centre
Nov. 30 & Dec. 1, 2011
15650 Addison Road
Addison, TX 75001
Morning seminars: 9:00am – 11:30am
Afternoon seminars: 1:30pm – 4:00pm
For More Information Contact:
Michelle Forbes (847) 437-6400 ext. 276
Email us your inquiry
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Microscopic voids, cracks and delaminations can escape conventional electrical testing, lying in wait to cause your component to fail. Attend one of our free seminars to get acquainted with how C-SAM® (C-Mode Scanning Acoustic Microscopes) can provide answers to some of the most complex component reliability questions. You’ll be introduced to C-SAM, the principles of ultrasound, and various applications and case studies. You will learn how you can inspect and upscreen parts to industry standards, differentiate between bond and disbond at interfaces within a variety of materials, and identify defects that can’t be visualized by any other technique, including X-ray.
Would you like to see how C-SAM works on your particular parts? Just bring along a component, and our experienced SonoLab™ acoustic professionals will perform a component analysis free of charge.
• Introduction to Acoustic Micro Imaging
• Defect Detection & Applications Overview
• Hands-On Equipment Demonstration
• Attendee Component Analyses
• Bond, weld & joint characterization
• Impact damage & fatigue assessment
• Isolate material property variations
• Measure material density, porosity, inclusions,
• discontinuities, etc.
• Assess interface adhesion
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